Fluke MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 2620A Hydra: (1 year) CAL VER IEEE /5700 DATE: 12-Aug-98 AUTHOR: Fluke Corporation REVISION: $Revision: 1.4 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 25 NUMBER OF LINES: 214 CONFIGURATION: Fluke 5700A ============================================================================= # # Source: # HYDRA # 2620A Data Acquisition Unit # 2625A Data Logger # 2635A Data Bucket # Service Manual, PN 889589, May 1991, Rev. 2, 11/93 # # Compatibility: # MET/CAL 4.23 or later # # Subprocedures: # None # # Required Files: # None # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5700A accuracy file contains 90 day specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 90 day specifications of the 5700A are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R Q N P F W 1.002 IEEE [SRQ OFF] 1.003 HEAD EQUIPMENT SETUP 1.004 DISP [32] WARNING 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 DISP Connect the UUT to an AC power source. 1.005 DISP Turn the UUT on. 1.005 DISP Warm-up time: 30 minutes. 1.005 DISP Ambient temperature: 18C - 28C. 1.005 DISP Relative humidity: less than 70%. 1.005 DISP 1.005 DISP Connect the Fluke Hydra to IEEE-488 port 1 on the PC. 1.006 DISP Verify that the Hydra is in IEEE-488 communication mode: 1.006 DISP Press SHIFT, then LIST to select COMM on the Hydra. 1.006 DISP If necessary, use the up arrow key to scroll until IEEE 1.006 DISP is shown on the main display. Press ENTER 1.006 DISP to show the IEEE-488 address. Make sure it is not zero. 1.006 DISP If necessary, use the up or down key to select 1.006 DISP a different address then press ENTER 1.007 HEAD PERFORMING SELF TEST... (~15s) 1.008 IEEE [T10000][SPL][SRQ ON]*TST?[10][D10000][I] 1.009 EVAL -e MEM == 0 : Self Test, status = [MEM] 2.001 JMP 25.002 FAIL 2.002 HEAD EQUIPMENT SETUP 2.003 DISP 2.003 DISP *************************************************** 2.003 DISP 2.003 DISP To reduce noise pickup by test leads, particularly 2.003 DISP during high Ohms verification, use shielded test 2.003 DISP cables between the Fluke 5700A and Fluke Hydra. 2.003 DISP 2.003 DISP *************************************************** 2.004 DISP Make the following connections to the Input Module: 2.004 DISP [32] 5700A OUTPUT HI to CH1 HI INPUT 2.004 DISP [32] 5700A OUTPUT LO to CH1 LO INPUT 2.004 DISP [32] 5700A SENSE HI to CH11 HI INPUT 2.004 DISP [32] 5700A SENSE LO to CH11 LO INPUT 2.005 RSLT = 2.006 RSLT = 2.007 HEAD {DIRECT VOLTAGE PERFORMANCE VERIFICATION} 2.008 IEEE *RST;FUNC 1,VDC,1;MON 1,1 2.009 5700 0.00mV S 2W 2.010 IEEE MON_VAL?[I] 2.011 MATH MEM = MEM * 1000 2.012 MEME 2.013 MEMC 300 mV 0.02U 3.001 5700 150.00mV S 2W 3.002 IEEE MON_VAL?[I] 3.003 MATH MEM = MEM * 1000 3.004 MEME 3.005 MEMC 300 mV 0.07U 4.001 5700 290.00mV S 2W 4.002 IEEE MON_VAL?[I] 4.003 MATH MEM = MEM * 1000 4.004 MEME 4.005 MEMC 300 mV 0.11U 5.001 IEEE MON 0;FUNC 1,VDC,2;MON 1,1 5.002 5700 2.9000V S 2W 5.003 IEEE MON_VAL?[I] 5.004 MEME 5.005 MEMC 3 V 0.0012U 6.001 5700 -2.9000V S 2W 6.002 IEEE MON_VAL?[I] 6.003 MEME 6.004 MEMC 3 V 0.0012U 7.001 IEEE MON 0;FUNC 1,VDC,3;MON 1,1 7.002 5700 29.000V S 2W 7.003 IEEE MON_VAL?[I] 7.004 MEME 7.005 MEMC 30 V 0.010U 8.001 IEEE MON 0;FUNC 1,VDC,4;MON 1,1 8.002 5700 150.00V S 2W 8.003 IEEE MON_VAL?[I] 8.004 MEME 8.005 MEMC 150 V 0.06U 9.001 5700 290.00V S 2W 9.002 IEEE MON_VAL?[I] 9.003 MEME 9.004 MEMC 300 V 0.10U 10.001 IEEE MON 0 10.002 5700 * S 10.003 RSLT = 10.004 HEAD {ALTERNATING VOLTAGE PERFORMANCE VERIFICATION} 10.005 IEEE FUNC 1,VAC,1;MON 1,1 10.006 5700 20.00mV 1kH O S 2W 10.007 IEEE MON_VAL?[I] 10.008 MATH MEM = MEM * 1000 10.009 MEME 10.010 MEMC 300 mV -0.29U +0.28U 1kH 11.001 5700 20.00mV 100kH O S 2W 11.002 IEEE MON_VAL?[I] 11.003 MATH MEM = MEM * 1000 11.004 MEME 11.005 MEMC 300 mV 1.50U 100kH 12.001 5700 290.00mV 1kH S 2W 12.002 IEEE MON_VAL?[I] 12.003 MATH MEM = MEM * 1000 12.004 MEME 12.005 MEMC 300 mV 0.74U 1kH 13.001 5700 290.00mV 100kH S 2W 13.002 IEEE MON_VAL?[I] 13.003 MATH MEM = MEM * 1000 13.004 MEME 13.005 MEMC 300 mV 15.00U 100kH 14.001 IEEE MON 0;FUNC 1,VAC,2;MON 1,1 14.002 5700 2.9000V 1kH S 2W 14.003 IEEE MON_VAL?[I] 14.004 MEME 14.005 MEMC 3 V 0.0066U 1kH 15.001 IEEE MON 0;FUNC 1,VAC,3;MON 1,1 15.002 5700 29.000V 1kH S 2W 15.003 IEEE MON_VAL?[I] 15.004 MEME 15.005 MEMC 30 V 0.069U 1kH 16.001 IEEE MON 0;FUNC 1,VAC,4;MON 1,1 16.002 5700 290.00V 1kH S 2W 16.003 IEEE MON_VAL?[I] 16.004 MEME 16.005 MEMC 300 V 0.66U 1kH 17.001 IEEE MON 0 17.002 5700 * S 17.003 RSLT = 17.004 HEAD {RESISTANCE PERFORMANCE VERIFICATION} 17.005 IEEE FUNC 1,OHMS,1,4;MON 1,1 17.006 5700 0.00Z S 4W 17.007 IEEE MON_VAL?[I] 17.008 MEME 17.009 MEMC 300 Z 0.09U 18.001 5700 190.00Z S 4W 18.002 IEEE MON_VAL?[I] 18.003 MEME 18.004 MEMC 300 Z -0.13U +0.2U 19.001 IEEE MON 0;FUNC 1,OHMS,2,4;MON 1,1 19.002 5700 0.0000kZ S 4W 19.003 IEEE MON_VAL?[I] 19.004 MATH MEM = MEM / 1000 19.005 MEME 19.006 MEMC 3 kZ 0.0003U 20.001 5700 1.9000kZ S 4W 20.002 IEEE MON_VAL?[I] 20.003 MATH MEM = MEM / 1000 20.004 MEME 20.005 TOL -0.0013U +0.0014U 20.006 MEMC 3 kZ TOL 21.001 IEEE MON 0;FUNC 1,OHMS,3,4;MON 1,1 21.002 5700 19.000kZ S 4W 21.003 IEEE MON_VAL?[I] 21.004 MATH MEM = MEM / 1000 21.005 MEME 21.006 MEMC 30 kZ 0.013U 22.001 IEEE MON 0;FUNC 1,OHMS,4,4;MON 1,1 22.002 5700 190.00kZ S 4W 22.003 IEEE MON_VAL?[I] 22.004 MATH MEM = MEM / 1000 22.005 MEME 22.006 MEMC 300 kZ 0.13U 23.001 IEEE MON 0;FUNC 1,OHMS,5,4;MON 1,1 23.002 5700 1.9000MZ S 4W 23.003 IEEE MON_VAL?[I] 23.004 MATH MEM = MEM / 1000000 23.005 MEME 23.006 MEMC 3 MZ 0.0014U 24.001 IEEE MON 0 24.002 5700 * S 24.003 RSLT = 24.004 HEAD {FREQUENCY PERFORMANCE VERIFICATION} 24.005 IEEE FUNC 1,FREQ,3;MON 1,1 24.006 5700 10.000kH 2.9V S 2W 24.007 IEEE MON_VAL?[I] 24.008 MATH MEM = MEM / 1000 24.009 MEME 24.010 MEMC 90 kH 0.006U 25.001 IEEE MON 0[GTL] 25.002 END